* Organizing Committee |
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T. Shiotani |
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Kyoto University, Japan (Chair) |
M. Enoki |
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The University of Tokyo, Japan |
S. Wakayama |
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Tokyo Metropolitan University, Japan |
A. Hase |
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Saitama Institute of Technology, Japan |
H. Cho |
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Aoyama Gakuin University, Japan |
H. Hatano |
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Tokyo University of Science, Japan |
H. Inaba |
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Fuji Ceramics Corporation, Japan |
K. Ito |
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The University of Tokyo, Japan |
K. Kageyama |
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Saitama University, Japan |
M. Maeda |
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Chiyoda Corporation, Japan |
T. Matsuo |
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Meiji University, Japan |
Y. Mizutani |
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Tokyo Institute of Technology, Japan |
H. Moriya |
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Tohoku University, Japan |
H. Nakamura |
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IHI Inspection & Instrumentation Co., Ltd., Japan |
S. Nishinoiri |
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Central Research Institute of Electric Power Industry, Japan |
Y. Obata |
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Nihon University, Japan |
K. Ohno |
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Tokyo Metropolitan University, Japan |
N. Okude |
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Tokai Technology Center, Japan |
K. Sato |
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Tokyo University of Agriculture and Technology, Japan |
T. Sakai |
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Saitama University, Japan |
M. Shigeishi |
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Kumamoto University, Japan |
M. Shiwa |
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National Institute for Material Science, Japan |
T. Suzuki |
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Niigata University, Japan |
M. Takuma |
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Kansai University, Japan |
T. Watanabe |
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The University of Tokushima, Japan |
T. Yasuda |
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Anan National College of Technology, Japan |
K. Yoshida |
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Tokushima Bunri University, Japan |
H. Yuki |
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The University of Electro-Communications, Japan |
S. Yuyama |
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Nippon Physical Acoustics, LTD., Japan |
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* Paper, Program & Award Committee |
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S. Yuyama |
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Nippon Physical Acoustics, LTD., Japan (Chair) |
T. Shiotani |
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Kyoto University, Japan |
M. Enoki |
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The University of Tokyo, Japan |
Y. Mizutani |
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Tokyo Institute of Technology, Japan |
S. Wakayama |
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Tokyo Metropolitan University, Japan |
T. Nishida |
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Kyoto University, Japan |
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* Secretary Committee |
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T. Shiotani |
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Kyoto University, Japan (Chair) |
T. Nishida |
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Kyoto University, Japan |
H. Asaue |
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Kyoto University, Japan |
K. Hashimoto |
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Kyoto University, Japan |
S. Kayano |
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Kyoto University (Hanshin Expressway Company), Japan |
N. Okude |
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Tokai Technology Center, Japan |
K. Ohno |
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Tokyo Metropolitan University, Japan |
T. Suzuki |
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Niigata University, Japan |
T. Watanabe |
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The University of Tokushima, Japan |
T. Yasuda |
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Anan National College of Technology, Japan |
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* Peer Review Committee |
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M. Ohtsu |
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Kyoto University, Japan (Chair) |
T. Shiotani |
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Kyoto University, Japan |
T. Nishida |
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Kyoto University , Japan |
G. Lacidogna |
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Politecnico di Torino, Italy |
G. Manthei |
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University of Applied Sciences, Germany |
A. Anastasopoulos |
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Envirocoustics, Greece |
C. R. Rios-Soberanis |
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Scientific Research Center of Yucatan, Mexico |
A. J. Brunner |
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Empa, Swiss Federal Laboratories for Materials Science and Technology, Switzerland |
J. C. Schmidt |
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Cracow University of Technology, Poland |
A. C. C. Tan |
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Queensland University of Technology, Australia |
H. Vallen |
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Vallen Systeme, GmbH, Germany |
G. Qi |
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The University of Memphis, U.S.A. |
D. Kosnik |
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CTL Group, USA |
D. G. Aggelis |
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Free University of Brussels, Belgium |
P. F. Filho |
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MISTRAS South America, Brazil |
A. Gallego |
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Universidad of Granada, Spain |
I. J. Baran |
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Cracow University of Technology, Poland |
M. Y. Choi |
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Korea Research Institute of Standards and Science, Korea |
D. Zarouchas |
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Delft University of Technology, The Netherlands |
H. K. Chai |
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University of Edinburgh, Scotland |
P. Pahalavan |
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TNO, The Netherlands |
G. Shen |
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China Special Equipment Inspection and Research Institute, China |
K. Ono |
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California University at Los Angeles, USA |
H. Asaue |
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Kyoto University, Japan |
K. Hashimoto |
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Kyoto University, Japan |
K. C. Chang |
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Kyoto University, Japan |
T. Suzuki |
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Niigata University, Japan |
T. Watanabe |
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Tokushima University, Japan |
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* International Advisory Board of IAES |
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D. Kosnik |
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CTL Group, USA |
D. G. Aggelis |
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Free University of Brussels, Belgium |
A. Gallego |
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Universidad of Granada, Spain |
K. Ono |
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University of California at Los Angeles, U.S.A. |
G. Qi |
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The University of Memphis, U.S.A. |
A. C.C. Tan |
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Queensland University of Technology, Australia |
D. Ozevin |
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University of Illinois, U.S.A. |
M. C. Forde |
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University of Edinburgh, Scotland |
G. Lacidogna |
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Politechnico di Torino, Italy |
G. Manthei |
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University of Applied Science, Germany |
A. Anastasopoulos |
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Envirocoustics, Greece |
P. F. Filho |
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MISTRAS South America, Brazil |
I. J. Baran |
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Cracow University of Technology, Poland |
T. Spies |
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BGR, Germany |
M. Y. Choi |
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Korea Research Institute of Standards and Science, Korea |
J. C. Schmidt |
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Cracow University of Technology, Poland |
A. J. Brunner |
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Empa, Swiss Federal Laboratories for Materials Science and Technology, Switzerland |
D. Zarouchas |
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Delft University of Technology, The Netherlands |
H. K. Chai |
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University of Edinburgh, Scotland |
P. L. Pahalavan |
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TNO, The Netherlands |
C. R. Rios-Soberanis |
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Scientific Research Center of Yucatan, Mexico |
H. Vallen |
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Vallen Systeme, Germany |
D. Yoon |
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Korea Research Institute of Standards and Science, Korea |
M.T. Mathew |
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University of Illinois, U.S.A. |
G. Shen |
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China Special Equipment Inspection and Research Institute, China |
P. Tscheliesnig |
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AT - Consult e.U. , Australia |